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The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields

Working paper
OECD Science, Technology and Industry Working Papers

Cite this content as:

Haščič, I., J. Silva and N. Johnstone (2015), “The Use of Patent Statistics for International Comparisons and Analysis of Narrow Technological Fields”, OECD Science, Technology and Industry Working Papers, No. 2015/05, OECD Publishing, Paris, https://doi.org/10.1787/5js03z98mvr7-en.
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