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23-Jul-2008
The International Workshop on Documentary Standards for Measurement and Characterisation in Nanotechnologies was held 26-28 February 2008 at the National Institute of Standards and Technology, Gaithersburg (USA), in co-ordination with ISO, IEC, NIST and the OECD. The participants discussed the development, efficacy, harmonisation and uptake of documentary standards broadly relevant to the field of measurement and characterisation for nanotechnologies. The final report of this meeting can be viewed by clicking on the link.
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