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News & Events
News
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15-Feb-2010
What are patent families? What is the impact of adopting one definition or another? Are some definitions of patent families better suited than others for certain uses in statistical and economic analysis? The aim of this working paper is to provide answers to these questions, compare methodologies and outcomes of the most commonly used patent family definitions, and provide guidance on how to build families based on raw data from the EPO Worldwide Patent Statistics database (PATSTAT).
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03-Feb-2010
This working paper presents the second edition of the technical guidelines used in the framework of the Careers of Doctorate Holders (CDH) project. It builds on the experience from the first large-scale data collection, which was based on the first edition of the technical guidelines released in 2007. In addition to a number of basic adjustments, it proposes new ways to measure post-doctoral positions and types of mobility, including international mobility.
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04-Jan-2010
An updated version is available, including annual values of exports and imports for all OECD countries and a selection of non-members as reporters. Data are presented in US dollars, broken down by partner and by industry, and from 1988 onwards.
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07-May-2008
The present edition constitutes the 2007-2008 update of the wide range of indicators which were published in 2006 but also includes new indicators and provides notes as to the measurement challenges and the data choices that were made.
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OECD countries take new approach to fostering innovation, says OECD report
25-Oct-2007
More and more OECD governments are giving firms tax breaks to drive innovation while cutting their direct spending on business research and development (R&D), and are also encouraging public research organisations to commercialise their inventions, according to a new OECD report.
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Events
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from 03-Sep-2008 to 04-Sep-2008
Organised by the European Patent Office (EPO) and the OECD, the goal of this conference was to reflect recent advances in the area of analysis with patent statistics.
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