Address of this page: www.oecd.org/sti/ipr-statistics
Patent indicators are used to map aspects of the innovative performance and technological progress of countries, regions or certain specific domains and technology fields. The use of patent statistics for monitoring developments in the field of science and technology has been expanding rapidly over the recent past. Not only have the use of patent indicators increased, but also the diversity and relevance of these indicators have progressed. The OECD has developed new and more sophisticated indicators, notably on patent families, citations, etc.
The goal of the 2013 conference is to present the latest empirical evidence based on patent and IP statistics and to discuss these findings with decision-makers from both the private and public sectors.
The underlying methodological information helps to design and interpret patent statistics in an accurate manner. The following issues (relating to patent statistics as S&T indicators) are being investigated:
The OECD Patent Statistics Manual (2009) capitalises on new experience on patent statistics and promote the harmonisation of methodologies. It addresses issues regarding the complexity of patent data and provide statisticians and analysts with guidelines for building and analysing patent-related indicators. The manual is available in English, French and Spanish.
The project activities are conducted in close co-operation with the members of the Patent Statistics Task Force, which gathers representatives from Eurostat, the European Patent Office (EPO), the Japan Patent Office (JPO), the Korean Intellectual Property Office (KIPO), the US National Science Foundation (NSF), the US Patent and Trademark Office (USPTO) and the World Intellectual Property Organization (WIPO).